Manoj Sachdev

title	media type	ISBN-13	year of publica- tion	other author(s)
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test	Paperback	978-90-481-7855-1	2010	Andrei Pavlov
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test	Hardcover	978-1-4020-8362-4	2008	"
Defect Oriented Testing for CMOS Analog and Digital Circuits	"	978-0-7923-8083-2	1997
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits	Paperback	978-1-4419-4285-2	2010	José Pineda de Gyvez
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits	Broschiert	978-0-387-51653-0	2008	Jos Pineda De Gyvez
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits	Hardcover	978-0-387-46546-3	2007	José Pineda de Gyvez
ESD Protection Device and Circuit Design for Advanced CMOS Technologies	Paperback	978-90-481-7836-0	2010	Oleg Semenov · Hossein Sarbishaei
ESD Protection Device and Circuit Design for Advanced CMOS Technologies	Hardcover	978-1-4020-8300-6	2008	Oleg Semenov · Hossein Sarbishaei
Thermal and Power Management of Integrated Circuits	"	978-0-387-25762-4	2006	Arman Vassighi