CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

by: Andrei Pavlov · Manoj Sachdev Hardcover details (USA). (see also: eBook (Kindle)) details (UK). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) details (Canada). (see also: eBook (Kindle)) ISBN: 978-1-4020-8362-4 ISBN-10: 1-4020-8362-9 Springer · 2008