CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

by Andrei Pavlov Paperback details (USA). (see also: eBook (Kindle)) details (UK). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) ISBN: 978-90-481-7855-1 ISBN-10: 90-481-7855-X Springer · 2010