Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Oriented

by: Manoj Sachdev · Jos Pineda De Gyvez

Broschiert

ISBN: 978-0-387-51653-0

ISBN-10: 0-387-51653-0

Springer Verlag Gmbh · 2008
See also:
2010PaperbackDefect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
2007HardcoverDefect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)