Academic Press · American Institute of Physics
| title | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|
| Characterization and Metrology for ULSI Technology 2005 | 978-0-7354-0277-5 | 2005 | Alain C. Diebold · Robert McDonald · Caroline R. Ayre · Rajinder P. Khosla · Stefan Zollner · Erik M. Secula |
| Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 978-0-7354-0712-1 | 2009 | Alain C. Diebold · Robert McDonald · C. Michael Garner · Dan Herr · Rajinder P. Khosla · Erik M. Secula |
| Frontiers of Characterization and Metrology for Nanoelectronics: 2011 | 978-0-7354-0973-6 | 2012 | Alain C. Diebold · Robert McDonald · Amal Chabli · Erik M. Secula |
| The Spectroscopy of Semiconductors, Volume 36 | 978-0-12-752136-7 | 1992 | Christopher L. Littler · Robert K. Willardson · Eicke R. Weber · Albert C. Beer |
D G · D.G. Seiler · D S · David G. · David S. · David Seiler · G S