Frontiers of Characterization and Metrology for Nanoelectronics: 2011 (AIP Conference Proceedings)

by: David G. Seiler · Alain C. Diebold · Robert McDonald · Amal Chabli · Erik M. Secula

Hardcover

ISBN: 978-0-7354-0973-6

ISBN-10: 0-7354-0973-0

American Institute of Physics · 2012

See also:
2009HardcoverFrontiers of Characterization and Metrology for Nanoelectronics: 2009 (AIP Conference Proceedings)