by: David G. Seiler · Alain C. Diebold · Robert McDonald · C. Michael Garner · Dan Herr · Rajinder P. Khosla · Erik M. Secula
Hardcover
ISBN: 978-0-7354-0712-1
ISBN-10: 0-7354-0712-6
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by: David G. Seiler · Alain C. Diebold · Robert McDonald · C. Michael Garner · Dan Herr · Rajinder P. Khosla · Erik M. SeculaHardcover
ISBN: 978-0-7354-0712-1 ISBN-10: 0-7354-0712-6 |
| See also: | ||
| 2012 | Hardcover | Frontiers of Characterization and Metrology for Nanoelectronics: 2011 (AIP Conference Proceedings) |