A.P. Thijssen

A. P. · P T

titlemedia typeISBN-13year of publica-
tion
other author(s)
Digital Techniques: From Problem to CircuitPaperback978-0-340-49099-01989etc. · H.A. Vink
Testability Concepts for Digital ICs: The Macro Test Approach   "978-1-4613-6004-92012F.P.M. Beenker · R.G. Bennetts
Testability Concepts for Digital ICs: The Macro Test ApproachHardcover978-0-7923-9658-11995F.P.M. Beenker · R.G. Bennetts
Variations: The Systematic Design of SupportsPaperback978-0-262-58032-81976N. J. Habraken · J. Th. Boekholt · P. J. M. Dinjens

Hodder & Stoughton · Springer · The MIT Press

 

A. P. Thirlwall