Testability Concepts for Digital ICs: The Macro Test Approach (Frontiers in Electronic Testing)

by: F.P.M. Beenker · R.G. Bennetts · A.P. Thijssen

Hardcover

details (USA).

details (Italy).
(see also: Copertina flessibile)

details (Spain - España).
(see also: Tapa blanda)

ISBN: 978-0-7923-9658-1

ISBN-10: 0-7923-9658-8

Springer · 1995