Testability Concepts for Digital ICs: The Macro Test Approach (Frontiers in Electronic Testing)

Electronic

by Frans Beenker

Paperback

ISBN: 978-1-4613-6004-9

ISBN-10: 1-4613-6004-8

Springer · 2012

See also:
1995HardcoverTestability Concepts for Digital ICs: The Macro Test Approach (Frontiers in Electronic Testing)