P.K. · R.K. · R. Khosla · R. P.
title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
---|---|---|---|
Characterization and Metrology for ULSI Technology 2005 | 978-0-7354-0277-5 (0-7354-0277-9) | 2005 | David G. Seiler · Alain C. Diebold · Robert McDonald · Caroline R. Ayre · Stefan Zollner · Erik M. Secula |
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 978-0-7354-0712-1 (0-7354-0712-6) | 2009 | David G. Seiler · Alain C. Diebold · Robert McDonald · C. Michael Garner · Dan Herr · Erik M. Secula |