| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Reliability Wearout Mechanisms in Advanced CMOS Technologies | Printed Access Code | 978-0-470-45526-5 (0-470-45526-8) | 2009 | Alvin W. Strong · Ernest Y. Wu · Rolf-Peter Vollertsen · Jordi Sune · Giuseppe La Rosa · Stewart E. Rauch III |
| Reliability Wearout Mechanisms in Advanced CMOS Technologies | Hardcover | 978-0-471-73172-6 (0-471-73172-2) | 2009 | Alvin W. Strong · Ernest Y. Wu · Rolf-Peter Vollertsen · Jordi Sune · Giuseppe La Rosa · Stewart E. Rauch III |
D S · D. Sullivan · T. D. · T.S. · T Sullivan · Timothy D. · Timothy daniel O'sullivan · Timothy Daniel Sullivan · Timothy S. · Timothy Sullivan