by: Alvin W. Strong · Ernest Y. Wu · Rolf-Peter Vollertsen · Jordi Sune · Giuseppe La Rosa · Timothy D. Sullivan · Stewart E. Rauch III
Hardcover
ISBN: 978-0-471-73172-6
ISBN-10: 0-471-73172-2
Wiley-IEEE Press · 2009
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by: Alvin W. Strong · Ernest Y. Wu · Rolf-Peter Vollertsen · Jordi Sune · Giuseppe La Rosa · Timothy D. Sullivan · Stewart E. Rauch IIIHardcover
ISBN: 978-0-471-73172-6 ISBN-10: 0-471-73172-2 Wiley-IEEE Press · 2009 |
| See also: | ||
| 2009 | Gedruckter Zugangscode | Reliability Wearout Mechanisms in Advanced Cmos Technologies |