by: Alvin W. Strong · Ernest Y. Wu · Rolf-peter Vollertsen · Jordi Sune
Gedruckter Zugangscode
ISBN: 978-0-470-45526-5
ISBN-10: 0-470-45526-8
IEEE Computer Society Press · 2009
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by: Alvin W. Strong · Ernest Y. Wu · Rolf-peter Vollertsen · Jordi SuneGedruckter Zugangscode
ISBN: 978-0-470-45526-5 ISBN-10: 0-470-45526-8 IEEE Computer Society Press · 2009 |
| See also: | ||
| 2009 | Hardcover | Reliability Wearout Mechanisms in Advanced CMOS Technologies |