| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Testability Concepts for Digital ICs: The Macro Test Approach | Paperback | 978-1-4613-6004-9 (1-4613-6004-8) | 2012 | F.P.M. Beenker · A.P. Thijssen |
| Testability Concepts for Digital ICs: The Macro Test Approach | Hardcover | 978-0-7923-9658-1 (0-7923-9658-8) | 1995 | F.P.M. Beenker · A.P. Thijssen |