| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach | Paperback | 978-0-367-40097-2 (0-367-40097-9) | 2019 | Michael G. Pecht · Edward B. Hakim |
| Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach | Hardcover | 978-0-8493-9450-8 (0-8493-9450-3) | 1997 | Michael Pecht · Edward B. Hakim |
| Prognostics and Health Management: A Practical Approach to Improving System Reliability Using Conditioned-Based Data | Gebunden | 978-1-119-35665-3 (1-119-35665-2) | 2019 | Douglas Goodman · James P. Hofmeister · Ferenc Szidarovszky |