Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Reliability

by: Pradeep Lall · Michael Pecht · Edward B. Hakim

Hardcover

ISBN: 978-0-8493-9450-8

ISBN-10: 0-8493-9450-3

CRC Press · 1997

See also:
2019PaperbackInfluence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach