Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

by: Pradeep Lall · Michael G. Pecht · Edward B. Hakim

Paperback

ISBN: 978-0-367-40097-2

ISBN-10: 0-367-40097-9

CRC Press · 30. August 2019

See also:
1997	Hardcover	Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)