E.B. · E.H. · Edward B. · Edward H.
| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach | Paperback | 978-0-367-40097-2 (0-367-40097-9) | 2019 | Pradeep Lall · Michael G. Pecht |
| Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach | Hardcover | 978-0-8493-9450-8 (0-8493-9450-3) | 1997 | Pradeep Lall · Michael Pecht |