David C. Joy

titlemedia typeISBN-13year of publica-
tion
other author(s)
Advanced Scanning Electron Microscopy and X-Ray MicroanalysisHardcover978-0-306-42140-21986Patrick Echlin · C.E. Fiori · Joseph Goldstein · Dale E. Newbury
Helium Ion Microscopy: Principles and ApplicationsPaperback978-1-4614-8659-62013
Monte Carlo Modeling for Electron Microscopy and MicroanalysisHardcover978-0-19-508874-81995
Scanning Electron Microscopy and X-Ray Microanalysis   "978-1-4939-6674-52017Joseph I. Goldstein · Dale E. Newbury · Joseph R. Michael · Nicholas W.M. Ritchie · John Henry J. Scott
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists   "978-0-306-44175-21992Joseph Goldstein · Dale E. Newbury · Patrick Echlin · Alton D. Romig Jr. · Charles E. Lyman · Charles Fiori · Eric Lifshin
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists   "978-0-306-40768-01981Joseph I. Goldstein · Dale E. Newbury · Patrick Echlin · Charles Fiori · Eric Lifshin
Scanning Electron Microscopy and X-Ray Microanalysis: Third EditionPaperback978-1-4613-4969-32013Joseph Goldstein · Dale E. Newbury · Charles E. Lyman · Patrick Echlin · Eric Lifshin · Linda Sawyer · J.R. Michael
Scanning Electron Microscopy and X-Ray Microanalysis: Third EditionHardcover978-0-306-47292-32007Joseph Goldstein · Dale E. Newbury · Charles E. Lyman · Patrick Echlin · Eric Lifshin · Linda Sawyer · J.R. Michael

C.J · D.C. · D. C. Joy · D. J. · David C. · David I.C. Joy · David J. · David Joy

Da Capo Press · Oxford University Press · Springer

 

David C. , Jr. Munson