title | media type | ISBN-13 | year of publica- tion | other author(s) |
---|---|---|---|---|
Advanced Scanning Electron Microscopy and X-Ray Microanalysis | Hardcover | 978-0-306-42140-2 | 1986 | Patrick Echlin · C.E. Fiori · Joseph Goldstein · Dale E. Newbury |
Helium Ion Microscopy: Principles and Applications | Paperback | 978-1-4614-8659-6 | 2013 | |
Monte Carlo Modeling for Electron Microscopy and Microanalysis | Hardcover | 978-0-19-508874-8 | 1995 | |
Scanning Electron Microscopy and X-Ray Microanalysis | " | 978-1-4939-6674-5 | 2017 | Joseph I. Goldstein · Dale E. Newbury · Joseph R. Michael · Nicholas W.M. Ritchie · John Henry J. Scott |
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists | " | 978-0-306-44175-2 | 1992 | Joseph Goldstein · Dale E. Newbury · Patrick Echlin · Alton D. Romig Jr. · Charles E. Lyman · Charles Fiori · Eric Lifshin |
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists | " | 978-0-306-40768-0 | 1981 | Joseph I. Goldstein · Dale E. Newbury · Patrick Echlin · Charles Fiori · Eric Lifshin |
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition | Paperback | 978-1-4613-4969-3 | 2013 | Joseph Goldstein · Dale E. Newbury · Charles E. Lyman · Patrick Echlin · Eric Lifshin · Linda Sawyer · J.R. Michael |
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition | Hardcover | 978-0-306-47292-3 | 2007 | Joseph Goldstein · Dale E. Newbury · Charles E. Lyman · Patrick Echlin · Eric Lifshin · Linda Sawyer · J.R. Michael |
C.J · D.C. · D. C. Joy · D. J. · David C. · David I.C. Joy · David J. · David Joy
Da Capo Press · Oxford University Press · Springer