Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Microscopy

by: Joseph Goldstein · Dale E. Newbury · David C. Joy · Charles E. Lyman · Patrick Echlin · Eric Lifshin · Linda Sawyer · J.R. Michael

Hardcover

ISBN: 978-0-306-47292-3

ISBN-10: 0-306-47292-9

Springer · 2007

See also:
2013PaperbackScanning Electron Microscopy and X-Ray Microanalysis: Third Edition