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by: Joseph Goldstein · Dale E. Newbury · David C. Joy · Charles E. Lyman · Patrick Echlin · Eric Lifshin · Linda Sawyer · J.R. MichaelHardcover details (USA). details (UK). details (Germany). details (Canada). ISBN: 978-0-306-47292-3 ISBN-10: 0-306-47292-9 Springer · 2007 |
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2013 | Paperback | Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition |