by: Joseph I. Goldstein · Dale E. Newbury · Joseph R. Michael · Nicholas W.M. Ritchie · John Henry J. Scott · David C. JoyHardcover details (USA). details (UK). details (Germany). details (Canada). ISBN: 978-1-4939-6674-5 ISBN-10: 1-4939-6674-X Springer · 2017 |
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2013 | Paperback | Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition |
2007 | Hardcover | Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition |