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by: Byung-Eun Park · Hiroshi Ishiwara · Masanori Okuyama · Shigeki Sakai · Sung-Min YoonHardcover details (USA). details (UK). details (Germany). details (Spain - España).
ISBN: 978-94-024-0839-3 ISBN-10: 94-024-0839-8 Springer · 2016 |
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2019 | Hardcover | Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications (Topics in Applied Physics) |