| year of publication | ISBN | author(s) | title |
|---|
| 1995 | 978-1-56677-096-5 | M. Meyyappan | Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing I (Proceedings ; v. 95-2) |
| 1996 | 978-1-56677-125-2 | Texas) Symposium on Electrochemical Capacitors 1996 (San Antonio · Frankm Delnick · Electrochemical Society Battery Division · Electrochemical Society Energy Technology Division · Electrochemical Society Physical Electrochemical Division | Proceedings of the Symposium on Electrochemical Capacitors II (Electrochemical Society Proceedings) |
| 1997 | 978-1-56677-149-8 | Proceedings of the Twenty-Seventh State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXVII) |
| '' | 978-1-56677-171-9 | M. Datta | Environmental Aspects of Electrochemical Technology (Proceedings) |
| '' | 978-1-56677-173-3 | Yue Kuo | Thin Film Transistor Technology III (Proceedings) |
| 1998 | 978-1-56677-193-1 | H. R. Huff · U. Gosele · H. Tsuya | Semiconductor Silicon, 1998 (No. Pv 98-1) |
| 1999 | 978-1-56677-207-5 | C. L. Claeys · P. Rai-Choudhury · M. Watanabe · P. Stalhofer · H. J. Dawson | High Purity Silicon V. (Proceeding Series Volume 98-13) |
| 1998 | 978-1-56677-216-7 | Massachus Symposium on Thin Film Transistor Technologies 1998 Boston · Yue Kuo · Electrochemical Society. Dielectric Science and Technology Division · Electrochemical Society Electronics Division | Thin Film Transistors Technologies: Proceedings of the Fourth Symposium on Thin Film Transistor Technologies (Electrochemical Society Proceedings) |
| 1999 | 978-1-56677-241-9 | C. L. Claeys · H. Iwai · G. Booner · Richard B. Fair | Ulsi Process Integration (Proceedings) |
| 2000 | 978-1-56677-254-9 | Interconnect and contact metallization for ULSI: Proceedings of the international symposium |
| 2001 | 978-1-56677-258-7 | C. E. Hunt | Semiconductor Wafer Bonding: Science, Technology, and Applications V: Proceedings of the International Symposia[sic] |
| 978-1-56677-259-4 | Cleaning Technology in Semiconductor Device Manufacturing: Proceedings of the Sixth International Symposium (Advances in Soil Science) |
| 2001 | 978-1-56677-294-5 | G. S. Mathad | Copper Interconnects, New Contact Metallurgies/Structures, and Low-K Interlevel Dielectrics: Proceedings of the International Symposium |
| 2002 | 978-1-56677-373-7 | L. Fabry, S. Kishino H. Huff | Semiconductor Silicon 2002: Volume 2 (Proceedings of the 9th International Symposium on Silicon Materials Science and Technology) |
| '' | 978-1-56677-374-4 | H. R. Huff · L. Fabry · S. Kishino | Semiconductor Silicon 2002: 9th International Symposium |
| 978-1-56677-375-1 | Silicon-On-Insulator Technology and Devices XI: Proceedings of the International Symposium |
| 2003 | 978-1-56677-376-8 | C. Claeys | Ulsi Process Integration III: Proceedings of the International Symposium |
| 978-1-56677-402-4 | Semiconductor Wafer Bonding VII: Science, Technology, and Applications: Proceedings of the International Symposium |
| 2003 | 978-1-56677-404-8 | S. · Electrochemical Society Seal | Chemical Mechanical Planarization VI: Proceedings of the International Symposium |
| 2005 | 978-1-56677-428-4 | Bernd O. Kolbesen · Cor Claeys · Lazlo Fabry · Francois Tardif | Cyrstalline Defects and Contamination: Their Impact and Control in Device Manufacturing IV - DECON 2005 |
| 2006 | 978-1-56677-438-3 | Electrochemical Society | Dielectrics for Nanosystems II: Materials Science, Processing, Reliability, and Manufacturing / Editors, D. Misra, H. Iwai |
| 978-1-56677-439-0 | Silicon Materials Science and Technology X (Ecs Transactions) |
| 2006 | 978-1-56677-444-4 | Electrochemical Society | Physics and Technology of High-K Gate Dielectrics III |
| 2005 | 978-1-56677-458-1 | Yue Kuo | Thin Film Transistor Technologies |
| '' | 978-1-56677-459-8 | R. E. Sah · M. J. Deen · J. F. Zhang · J. Yota · Y. Kamakura | Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Other Emerging Dielectrics VIII 2005 |
| 2005 | 978-1-56677-460-4 | K. D. Hobart · S. Bengtsson · H. Baumgart · T. Suga · C. E. Hunt | Semiconductor Wafer Bonding VIII: Science, Technology, and Applications, 2005: Proceedings Of The International Symposium |
| '' | 978-1-56677-462-8 | P. C. Chang · D. N. Buckley · S. Ahmed · K. Shiojima | State-of-the-Art Program on Compound Semiconductors XLII -and- Processes at the Compound-Semiconductor/Solution Interface, 2005: Proceedings Of The International Symposium |
| 2006 | 978-1-56677-503-8 | Electrochemical Society | Physics and Technology of High-K Gate Dielectrics 4 |
| '' | 978-1-56677-505-2 | '' | State-Of-The-Art Program on Compound Semiconductors 45 (Sotapocs 45) and Wide Bandgap Semiconductor Materials and Devices 7 / Editors, F. Ren ... [Et |
| 978-1-56677-512-0 | Microelectronics Technology and Devices Sbmicro2006 |
| 2007 | 978-1-56677-542-7 | Electrochemical Society | Atomic Layer Deposition Applications 2 |
| '' | 978-1-56677-549-6 | M. C. Williams | 30th Fuel Cell Seminar |
| 978-1-56677-550-2 | Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS 3; New Materials, Processes and Equipment; Proceedings: Advanced Gate Stac (Ecs Transactions) |
| 2007 | 978-1-56677-551-9 | C. O'Dwyer | State-Of-The-Art Program on Compound Semiconductor 46 (Sotapocs 46) and Processes at the Semiconductor/Solution Interface 2; Proceedings: State-Of-The |
| '' | 978-1-56677-552-6 | R. E. Sah | Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics; Proceedings: International Symposium on Silicon Nitride and Silicon Dioxide Thin Insulatin |
| 2007 | 978-1-56677-553-3 | G. K. Celler | Silicon-On-Insulator Technology and Devices 13; Proceedings: International Symposium on Silicon-On-Insulator Technology and Devices (13th--2007--Chica |
| '' | 978-1-56677-565-6 | J. A. Martino | Microelectronics Technology and Devices; Proceedings: International Symposium on Microelectronics Technology and Devices (22d--2007--Rio de Janeiro, B |
| '' | 978-1-56677-568-7 | T. Hattori | Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing; Proceedings: Int'l Symposium on Semiconductor Cleaning and Surface |
| '' | 978-1-56677-592-2 | Electrochemical Society | Molten Salts 15: In Memory of Robert Osteryoung |
| 978-1-56677-626-4 | Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS 3; New Materials, Processes and Equipment; Proceedings: Advanced Gate Stac |
| 2008 | 978-1-56677-646-2 | J. W. Swart · et al | Microelectronics Technology and Devices-SBMicro 208; Proceedings: International symposium on Microelectronics Technology and Devices (23d: 2008: Grama |
| '' | 978-1-56677-656-1 | David Harame · et al | SiGe, Ge and Related Compounds 3; Materials, Processing, and Devices; Proceedings. (CD-ROM Included): SiGe, Ge, and Related Compounds: Materials, Proc |