Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

Variation

by: Mohamed H Abu-Rahma · Mohab Anis

Paperback

ISBN: 978-1-4614-1749-1

ISBN-10: 1-4614-1749-X

Not Avail
See also:
2014PaperbackNanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
2012HardcoverNanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
2012PaperbackNanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield