Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield

by: Mohamed Abu Rahma · Mohab Anis

Hardcover

details (USA).
(see also: eBook (Kindle))

details (United Kingdom).
(see also: eBook (Kindle))

details (Germany).
(see also: Kindle Ausgabe)

details (Canada).
(see also: eBook (Kindle))

ISBN: 978-1-4614-1748-4

ISBN-10: 1-4614-1748-1

Springer · 2012