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by: Mohamed Abu Rahma · Mohab AnisPaperback details (USA). details (Canada). ISBN: 978-1-4614-1750-7 ISBN-10: 1-4614-1750-3 Springer · 2012 |
| See also: | ||
| 2014 | Paperback | Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield |
| 2012 | Hardcover | Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield |