Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

Reliability

by: L.J. Balk · W.H. Gerling · E. Wolfgang

CD-ROM

ISBN: 978-0-08-043914-3

ISBN-10: 0-08-043914-4

Pergamon · 2000
See also (possibly by other authors):
1999PaperbackProceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99) (Volume 39, Numbers 6-7)
1999CD-ROMProceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99)