Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99) (Volume 39, Numbers 6-7)

Reliability

by: N. Labat · A. Touboul

Paperback

ISBN: 978-0-08-043419-3

ISBN-10: 0-08-043419-3

Pergamon · 1999
See also:
1999CD-ROMProceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99)