Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99)

Proceedings

by: N. Labat · A. Touboul

CD-ROM

ISBN: 978-0-08-043420-9

ISBN-10: 0-08-043420-7

Pergamon · 1999

See also:
1999PaperbackProceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99) (Volume 39, Numbers 6-7)