by: N. Labat · A. TouboulCD-ROM
ISBN: 978-0-08-043420-9 ISBN-10: 0-08-043420-7 Pergamon · 1999 |
See also: | ||
1999 | Paperback | Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99) (Volume 39, Numbers 6-7) |