| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Power-Aware Testing and Test Strategies for Low Power Devices | 978-1-4419-0927-5 (1-4419-0927-3) | 2009 | Patrick Girard · Nicola Nicolici |
| VLSI Test Principles and Architectures: Design for Testability | 978-0-12-370597-6 (0-12-370597-5) | 2006 | Laung-Terng Wang · Cheng-Wen Wu |