VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

by: Laung-Terng Wang · Cheng-Wen Wu · Xiaoqing Wen

Hardcover

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ISBN: 978-0-12-370597-6

ISBN-10: 0-12-370597-5

Morgan Kaufmann · 2006