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Wei-Ting Kary Chien
title
ISBN-13
(ISBN-10)
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other author(s)
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
978-O-7923-81O7-5
(O-7923-81O7-6)
1998
Way Kuo · Taeho Kim
K. C.
·
T. C.
·
T/K
·
W.C.
·
W. Chien
·
W. K.
·
W. T.
Wei Tong