Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
by:
Way Kuo
· Wei-Ting Kary Chien · Taeho Kim
Hardcover
details (
USA
).
ISBN: 978-0-7923-8107-5
ISBN-10: 0-7923-8107-6
Springer
· 1998
