| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Life and culture to learn in travel | 978-89-93814-11-8 (89-93814-11-2) | 2009 | |
| Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development | 978-0-7923-8107-5 (0-7923-8107-6) | 1998 | Way Kuo · Wei-Ting Kary Chien |