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Sudarshan Bahukudumbi
S. B
title
ISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
978-1-59693-989-9
(1-59693-989-3)
2010
Krishnendu Chakrabarty
Suddhendu Biswas
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