| title | media type | ISBN-13 (ISBN-10) | year of publication |
|---|---|---|---|
| Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling | Paperback | 978-81-322-3424-1 (81-322-3424-3) | 2016 |
| Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling | Hardcover | 978-81-322-2507-2 (81-322-2507-4) | 2015 |