Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (Springer Series in Advanced Microelectronics)

by Souvik Mahapatra Hardcover details (United States). (see also: eBook (Kindle)) details (UK). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) ISBN: 978-81-322-2507-2 ISBN-10: 81-322-2507-4 Springer · 2015