| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits | 978-1-4398-2941-7 (1-4398-2941-1) | 2011 | Krishnendu Chakrabarty |
S. G. · S.K. · S. Kumar · Sandeep Goel · Sandeep K. Goel · Sandeep Kumar