S. G. · S.K. · Sandeep Goel · Sandeep Kumar Goel
| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits | Hardcover | 978-1-4398-2941-7 (1-4398-2941-1) | 2013 | Krishnendu Chakrabarty |
| Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits | Digital | 978-1-4398-2942-4 (1-4398-2942-X) | 2013 | " |