There has been data ("Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems) - ISBN-13 978-1-4398-2942-4") available for this ISBN from the data sources that books-by-isbn.com uses, but not on the latest request on Tue Oct 8 20:32:47 2019, so the data displayed here has been removed .