Norbert Meyen-Dorf

title	ISBN-13 (ISBN-10)	year of publica- tion	other author(s)
Testing, Reliability, And Application Of Micro-And Nano-Material Systems III	978-O-8194-5747-9 (O-8194-5747-7)	2005	Robert E. Geer · George Y. Baaklini · Bernd Michel