Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)

by: Robert E. Geer · Norbert Meyendor · George Y. Baaklini · Bernd Michel

Paperback

details (United States).

ISBN: 978-0-8194-5747-9

ISBN-10: 0-8194-5747-7

Society of Photo Optical · 2005