| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | 978-1-4419-O937-4 (1-4419-O937-O) | 2009 | Alberto Bosio · Patrick Girard · Serge Pravossoudovitch · Arnaud Virazel |