Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Technologies

by: Alberto Bosio · Luigi Dilillo · Patrick Girard · Serge Pravossoudovitch · Arnaud Virazel

Hardcover

ISBN: 978-1-4419-0937-4

ISBN-10: 1-4419-0937-0

Springer · 2009