L. W. · L. Wang · T W · T. Wang
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Electronic Design Automation: Synthesis, Verification, and Test | 978-0-12-374364-0 (0-12-374364-8) | 2009 | Yao-Wen Chang · Kwang-Ting (Tim) Cheng |
| System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability | 978-0-12-373973-5 (0-12-373973-X) | 2007 | Charles E. Stroud · Nur A. Touba |
| VLSI Test Principles and Architectures: Design for Testability | 978-0-12-370597-6 (0-12-370597-5) | 2006 | Cheng-Wen Wu · Xiaoqing Wen |