Kin P. Cheung

K. C. · K.P. · K. P. Cheung · P. C.

IEEE · Springer

titlemedia typeISBN-13year of publica-
tion
other author(s)
1996 1st International Symposium on Plasma Process-Induced Damage: 13-14 May 1996, Santa Clara, California, USAPaperback978-0-9651577-0-41996Moritaka Nakamura · Calvin T. Gabriel
1997 2nd International Symposium on Plasma Process-Induced Damage, Pip: 13-14 May 1997, Monterey, California, USAHardcover978-0-9651577-1-11998Calif.) International Symposium on Plasma Process-Induced Damage (2nd : 1997 : Monterey · Moritaka Nakamura · Calvin T. Gabriel · American Vacuum Society · Oyo Butsuri Gakkai
Plasma Charging DamagePaperback978-1-4471-1062-02012
Plasma Charging DamageHardcover978-1-85233-144-32000K. P. Cheung

 

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