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> Jos Pineda De Gyvez
Jos Pineda De Gyvez
title
ISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
978-O-387-51653-O
(O-387-51653-O)
2008
Manoj Sachdev
D. G.
·
J.D.
·
J. G.
·
J. P.
·
P.G.
Jos? Pinero