| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications | Paperback | 978-94-024-0205-6 (94-024-0205-5) | 2016 | |
| Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications | Hardcover | 978-94-007-7662-3 (94-007-7662-4) | 2013 | Ben Kaczer · Guido Groeseneken |