Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)

by: Jacopo Franco · Ben Kaczer · Guido Groeseneken Hardcover details (USA). (see also: eBook (Kindle)) details (UK). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) ISBN: 978-94-007-7662-3 ISBN-10: 94-007-7662-4 Springer · 2013